The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Dec. 22, 2010
Applicant:

Alexander Seth Ross, Albany, NY (US);

Inventor:

Alexander Seth Ross, Albany, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 19/00 (2013.01); G01C 25/00 (2006.01); G01D 18/00 (2006.01); G01F 25/00 (2006.01); A61B 5/05 (2006.01); A61B 5/053 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0536 (2013.01); A61B 5/6843 (2013.01); A61B 5/7221 (2013.01);
Abstract

A soft-field tomography system includes a plurality of transducers configured for positioning at a surface of an object. An excitation driver is configured to generate a precomputed default excitation pattern for the plurality of transducers. A processor stores the precomputed default excitation pattern and a corresponding predicted response for the precomputed excitation pattern. The processor further stores one or more precomputed fault excitation patterns and corresponding predicted response for the fault excitation patterns corresponding to one or more fault conditions of the plurality of transducers. A response measurement device is configured to measure a response at one or more of the transducers to determine if a fault condition exists. If a fault condition exists, the processor at least one of instructs the excitation driver to generate a precomputed fault excitation pattern or uses a predicted response that corresponds to the fault condition for a soft field tomography process.


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