The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Feb. 10, 2010
Applicants:

Richard Stafford, Bountiful, UT (US);

David E. Norman, Bountiful, UT (US);

Inventors:

Richard Stafford, Bountiful, UT (US);

David E. Norman, Bountiful, UT (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/38 (2006.01); G06N 3/02 (2006.01); G06F 19/00 (2011.01); G06Q 10/04 (2012.01); G06Q 10/06 (2012.01); G06F 15/00 (2006.01); G06F 9/455 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/04 (2013.01); G06Q 10/06 (2013.01);
Abstract

A method and system for the use of prediction data in monitoring actual production targets is described herein. In one embodiment, a process is provided to receive data from a plurality of source systems in a manufacturing facility and generate a prediction pertaining to a future state of the manufacturing facility based on the data received from the plurality of source systems. A recent state of the manufacturing facility is determined based on the data received from the plurality of source systems and a comparison between the recent state and the prediction is facilitated.


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