The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2015
Filed:
Mar. 06, 2013
Qualcomm Incorporated, San Diego, CA (US);
Fan Wang, Sunnyvale, CA (US);
An-Swol C. Hu, Belmont, CA (US);
Sundaresan Tambaram Kailasam, San Diego, CA (US);
Uzma Khan, San Marcos, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
The present disclosure presents a method and apparatus for determining reselection parameters for detected cells. For example, the method may include receiving system information block (SIB) data associated with one or more cells in a neighbor cell list (NCL). In such example, the SIB data may include a ranking offset parameter associated with each of the NCL cells. Furthermore, such an example method may include detecting a cell that is not in the NCL, determining a reselection ranking value associated with each of the NCL cells, the detected cell and the serving cell. In addition, in some examples, such method may include ranking the one or more NCL cells, the detected cell and the serving cell in a ranking list based on the reselection ranking values. As such, reselection parameters for detected cells may be determined.