The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Feb. 28, 2011
Applicants:

Emmanuel Le Taillandier DE Gabory, Tokyo, JP;

Kiyoshi Fukuchi, Tokyo, JP;

Manabu Arikawa, Tokyo, JP;

Inventors:
Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 10/12 (2006.01); H04B 10/06 (2006.01); H04B 10/07 (2013.01); H04B 10/077 (2013.01);
U.S. Cl.
CPC ...
H04B 10/07 (2013.01); H04B 10/0775 (2013.01);
Abstract

Since it is difficult to fast, simply monitor impairments of received signals with higher receiver sensitivity, a monitoring method for an optical communication system according to an exemplary aspect of the invention includes the steps of emitting lightwave signals to be modulated according to a data, forming dips at transitions between temporally consecutive groups of n symbols of the lightwave signals, wherein the dips are formed at each of (n−1) first transitions of the group, no dip is formed at the n-th transition on the lightwave signals, receiving the lightwave signals, extracting frequency components characterized by the numerical value n from received lightwave signals, and monitoring the received lightwave signals by using the frequency components.


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