The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Jun. 11, 2012
Applicants:

Hui Cheng, Bridgewater, NJ (US);

Harpreet Singh Sawhney, West Windsor, NJ (US);

Bogdan Calin Mihai Matei, Princeton Junction, NJ (US);

Zhiwei Zhu, Princeton, NJ (US);

Nicholas John Vander Valk, Monmouth Junction, NJ (US);

Inventors:

Hui Cheng, Bridgewater, NJ (US);

Harpreet Singh Sawhney, West Windsor, NJ (US);

Bogdan Calin Mihai Matei, Princeton Junction, NJ (US);

Zhiwei Zhu, Princeton, NJ (US);

Nicholas John Vander Valk, Monmouth Junction, NJ (US);

Assignee:

SRI International, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00671 (2013.01);
Abstract

A method and apparatus for determining a geographic location of a scene in a captured depiction comprising extracting a first set of features from the captured depiction by algorithmically analyzing the captured depiction, matching the extracted features of the captured depiction against a second set of extracted features associated with reference depictions with known geographic locations and when the matching is successful, identifying the geographic location of the scene in the captured depiction based on a known geographic location of a matching reference depiction from the reference depictions.


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