The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Dec. 19, 2012
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Jonathan Immanuel Sperl, Freising, DE;

Dirk Wim Jos Beque, Munich, DE;

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G01N 23/04 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/001 (2013.01); G01N 23/046 (2013.01); G01N 2223/419 (2013.01); G01N 2223/612 (2013.01);
Abstract

A phase retrieval method for differential phase contrast imaging includes receiving data corresponding to a differential phase image generated from a measured signal. The measured signal corresponds to an X-ray signal detected by a detector after passing through a subject located with a grating arrangement between an X-ray source and the detector. The method further includes generating a phase image corresponding to the integration of the differential phase image. Generating the phase image includes performing an iterative total variation regularized integration in the Fourier domain.


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