The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Apr. 18, 2012
Applicants:

Michael Liesenfelt, Knoxville, TN (US);

Dan Shedlock, Knoxville, TN (US);

William Talion Edwards, Foristell, MO (US);

Inventors:

Michael Liesenfelt, Knoxville, TN (US);

Dan Shedlock, Knoxville, TN (US);

William Talion Edwards, Foristell, MO (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/60 (2006.01); G01N 23/203 (2006.01);
U.S. Cl.
CPC ...
G01N 23/203 (2013.01);
Abstract

Methods and systems for use in generating a volumetric reconstruction of an object using scattered X-ray radiography. An X-ray beam is directed towards a point within a target object. Scattered X-rays are measured by detectors and measurement data is stored. The X-ray beam is directed towards different points. Measurement data associated with each point is analyzed using a ray tracing methodology to assign contrast values to each point. A volumetric image is generated therefrom.


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