The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Jun. 01, 2012
Applicants:

Hamid A. Toliyat, College Station, TX (US);

Mahshid Amirabadi, College Station, TX (US);

Inventors:

Hamid A. Toliyat, College Station, TX (US);

Mahshid Amirabadi, College Station, TX (US);

Assignee:

Texas A&M University System, College Station, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02M 3/335 (2006.01); H02M 5/458 (2006.01);
U.S. Cl.
CPC ...
H02M 5/4585 (2013.01); Y02B 70/145 (2013.01);
Abstract

Three resonance-based universal power converter topologies are disclosed. One includes a partially resonant parallel L-C link and incorporates intermediate cross-over switching circuits between the link stage and each of the input and output stages (which are constructed using unidirectional switches), thereby permitting the partially resonant circuit to be operated bi-directionally. A second includes a partially resonant series LC link in parallel with the input and output networks. A third includes a partially resonant series LC link in series between the input and output networks. The input and output networks can be formed from either bidirectional switches or a combination of unidirectional switches and intermediate cross-over switching circuits, permitting the partially resonant circuit to be operated bi-directionally. All embodiments permit the use of smaller reactive components in the link stage and the use of AC rather than DC capacitors, which reduces size and costs of the device while increasing the reliability.


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