The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Jun. 02, 2014
Applicant:

Western Digital Technologies, Inc., Irvine, CA (US);

Inventors:

Yee Ching Liew, Irvine, CA (US);

Jinghuan Chen, Irvine, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01); G11B 27/36 (2006.01); G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
G11B 20/1816 (2013.01);
Abstract

Track placement on a disk of a Data Storage Device (DSD) including writing test data in a plurality of sectors in a test track on the disk. An adjacent track on the disk is written offset from the test track by an offset distance. Data is read from the test track from an Off-Track Read Capability (OTRC) position outside of the test track. An OTRC value is determined for each sector of the plurality of sectors by varying the OTRC position and determining whether the sector meets a criterion for correctly reading data from the sector. An average OTRC value and a standard deviation are calculated for the plurality of sectors. If it is determined that the average OTRC value is greater than or equal to the predetermined multiple of the standard deviation of the OTRC values, the adjacent track is rewritten at a decreased offset distance.


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