The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Oct. 18, 2013
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Ye Yin, Sunnyvale, CA (US);

Gabriel G. Marcu, San Jose, CA (US);

Jiaying Wu, San Jose, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/28 (2013.01);
Abstract

This specification describes various embodiments that relate to methods for providing a wideband colorimeter that can include more accurate outputs. In one embodiment, a narrowband instrument, such as a spectrometer or spectrograph, can be used for calibration of a wideband colorimeter, so that more accurate outputs can be provided. In one embodiment, an optical test equipment, which consists of both a wideband colorimeter and a narrowband spectrograph, can be used for providing a more accurately calibrated wideband colorimeter. As an example, a spectra-camera, which is a hybrid system consisting of both a wideband colorimeter and a narrowband spectrograph, can be used for simultaneous testing by both the wideband colorimeter and the narrowband spectrograph. By doing simultaneous testing, accurate calibration of the wideband colorimeter can be achieved. This specification further describes a mathematical model to characterize a wideband three channel colorimeter with a narrowband multiple channel spectrometer.


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