The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2015
Filed:
Jul. 19, 2012
Ming-chang Liu, San Jose, CA (US);
Mark Robertson, Cupertino, CA (US);
Ming-Chang Liu, San Jose, CA (US);
Mark Robertson, Cupertino, CA (US);
Sony Corporation, Tokyo, JP;
Abstract
A method for improving depth for field (DOF) in microscopic imaging, the method comprising combining a sequence of images captured from different focal distances to form an all-focus image, comprising computing a focus measure at every pixel, finding the largest peaks at each position in the focus measure as multiple candidate values and blending the multiple candidates values according to the focus measure to determine the all-focus image.
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