The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2015
Filed:
Jun. 12, 2014
Lytro, Inc., Mountain View, CA (US);
Chia-Kai Liang, San Jose, CA (US);
Colvin Pitts, Snohomish, WA (US);
Kurt Akeley, Saratoga, CA (US);
Alex Song, San Jose, CA (US);
Lytro, Inc., Mountain View, CA (US);
Abstract
Depth information is determined for elements in a light field image, thus allowing for rapid display of visualization tools to communicate such depth information to a user. Depth of strong edges within the light field image is analyzed, providing improved reliability of depth information while reducing or minimizing the amount of computation involved in generating such information. Strong edges can be identified and analyzed by generating epipolar images, or EPIs, from the light field image. Local gradients are determined for pixels in the EPIs. The magnitude of the local gradient is used to determine a confidence as to whether depth can be reliably estimated from the gradient. The orientation of the gradient is used to determine the depth of a corresponding element of the scene. Suitable output is then generated based on the determined depths, for example to provide information and feedback to aid a user in capturing light-field images.