The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2015
Filed:
Jul. 05, 2011
Applicants:
Andre DE Oliveira, Erlangen, DE;
Matthias Fenchel, Erlangen, DE;
Wilhelm Horger, Schwaig, DE;
Inventors:
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/56 (2006.01); A61B 5/055 (2006.01); G01R 33/54 (2006.01); A61B 5/20 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5608 (2013.01); A61B 5/055 (2013.01); G01R 33/543 (2013.01); A61B 5/201 (2013.01); A61B 5/4064 (2013.01); A61B 5/4244 (2013.01); A61B 5/4381 (2013.01);
Abstract
An embodiment of the invention relates to the generation of MR images of a volume section within an examination object by way of a magnetic resonance scanner. In at least one embodiment, the following steps are performed: generating at least one of the MR images; automatically performing a number of quality inspections on the at least one MR image; and, should one of these quality inspections fail, an action is automatically performed in order to improve a quality when generating more of the MR images.