The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Feb. 10, 2011
Applicants:

Panagiotis George Datskos, Knoxville, TN (US);

Nickolay Lavrik, Knoxville, TN (US);

Inventors:

Panagiotis George Datskos, Knoxville, TN (US);

Nickolay Lavrik, Knoxville, TN (US);

Assignees:

U.S. Department of Energy, Washington, DC (US);

UT-Battelle, LLC, Oak Ridge, TN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 29/08 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0878 (2013.01); G01R 1/06738 (2013.01); G01R 1/06744 (2013.01);
Abstract

The present invention provides a system for detecting and analyzing at least one of an electric field and an electromagnetic field. The system includes a micro/nanomechanical oscillator which oscillates in the presence of at least one of the electric field and the electromagnetic field. The micro/nanomechanical oscillator includes a dense array of cantilevers mounted to a substrate. A charge localized on a tip of each cantilever interacts with and oscillates in the presence of the electric and/or electromagnetic field. The system further includes a subsystem for recording the movement of the cantilever to extract information from the electric and/or electromagnetic field. The system further includes a means of adjusting a stiffness of the cantilever to heterodyne tune an operating frequency of the system over a frequency range.


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