The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Dec. 10, 2008
Applicants:

Reinhold Wimberger-friedl, Eindhoven, NL;

Marius Iosif Boamfa, Eindhoven, NL;

Erik Martinus Hubertus Petrus Van Dijk, Eindhoven, NL;

Inventors:
Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F21V 9/16 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6456 (2013.01);
Abstract

A detection system, comprising: a radiation source () for providing input radiation; a radiation focusing arrangement () for providing the input radiation to an analysis region of a sample ();—a radiation collection () arrangement for collecting output radiation from the analysis region of the sample resulting from interaction of the input radiation with the sample; a radiation detector () for detecting the collected output radiation; operating means () for operating the detection device in a first detection mode and a second detection mode, wherein in the first detection mode the analysis has a first size and/or shape and wherein in the second detection mode the analysis region has a second size and/or shape that is different from the first size and/or shape.


Find Patent Forward Citations

Loading…