The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2015
Filed:
Sep. 14, 2012
Ho Soo Park, Yongin-si, KR;
IN Sang Song, Osan-si, KR;
Duck Hwan Kim, Goyang-si, KR;
Chul Soo Kim, Hwaseong-si, KR;
Sang Uk Son, Yongin-si, KR;
Jea Shik Shin, Hwaseong-si, KR;
Cui Jing, Yongin-si, KR;
Ho Soo Park, Yongin-si, KR;
In Sang Song, Osan-si, KR;
Duck Hwan Kim, Goyang-si, KR;
Chul Soo Kim, Hwaseong-si, KR;
Sang Uk Son, Yongin-si, KR;
Jea Shik Shin, Hwaseong-si, KR;
Cui Jing, Yongin-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A temperature sensing apparatus and method are described to detect a change in a frequency due to a change in a temperature. An infrared light sensing apparatus and method are also provided. The temperature sensing apparatus may include an electrode to generate an electrical signal, a piezoelectric layer to convert the electrical signal into an acoustic wave, and a temperature sensitive layer formed by doping impurities in one or more structures formed on a substrate. Additionally, the infrared light sensing apparatus may convert into heat infrared light incident to an infrared light absorption layer, using an infrared light reflection layer and the infrared light absorption layer. A temperature sensitive layer may detect a change in a resonant frequency based on a change in a temperature of the heat, and may detect a change in infrared light based on the change in the resonant frequency.