The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Aug. 19, 2011
Applicants:

Yoshihisa Ito, Aichi, JP;

Shinji Kato, Aichi, JP;

Inventors:

Yoshihisa Ito, Aichi, JP;

Shinji Kato, Aichi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C04B 35/48 (2006.01); C04B 35/49 (2006.01); C01G 25/02 (2006.01); C04B 35/486 (2006.01); C04B 35/488 (2006.01); C04B 35/645 (2006.01);
U.S. Cl.
CPC ...
C01G 25/02 (2013.01); C04B 35/481 (2013.01); C04B 35/486 (2013.01); C04B 35/4885 (2013.01); C04B 35/6455 (2013.01); C04B 2235/3246 (2013.01); C04B 2235/762 (2013.01); C04B 2235/765 (2013.01); C04B 2235/3206 (2013.01); C04B 2235/3208 (2013.01); C04B 2235/3217 (2013.01); C04B 2235/3222 (2013.01); C04B 2235/3409 (2013.01); C04B 2235/3418 (2013.01); C04B 2235/3463 (2013.01); C04B 2235/3821 (2013.01); C04B 2235/386 (2013.01); C04B 2235/3873 (2013.01); C04B 2235/428 (2013.01); C04B 2235/441 (2013.01); C04B 2235/447 (2013.01); C04B 2235/72 (2013.01); C04B 2235/727 (2013.01); C04B 2235/96 (2013.01); C04B 2235/42 (2013.01); C04B 2235/656 (2013.01); C04B 2235/662 (2013.01); C04B 2235/75 (2013.01); C04B 2235/785 (2013.01); C04B 2235/9669 (2013.01);
Abstract

A sintering composition and calcined object which are precursors for a sintered zirconia. The burned surface of the sintered zirconia gives an X-ray diffraction pattern in which the ratio of the height of the peak present around the location where a [200] peak assigned to the cubic system is to appear to the height of the peak present around the location where a [200] peak assigned to the tetragonal system is to appear is 0.4 or more, and a region located at a depth of 100 μm or more from the burned surface gives an X-ray diffraction pattern in which the ratio of the height of the peak present around the location where a [200] peak assigned to the cubic system is to appear to the height of the peak present around the location where a [200] peak assigned to the tetragonal system is to appear is 0.3 or less.


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