The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Dec. 01, 2010
Applicants:

Kent Lang, Denver, CO (US);

Gilles Mathieu, Meudon, FR;

Roland Banas, Tucson, AZ (US);

Robert A. Will, Littleton, CO (US);

Inventors:

Kent Lang, Denver, CO (US);

Gilles Mathieu, Meudon, FR;

Roland Banas, Tucson, AZ (US);

Robert A. Will, Littleton, CO (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C22B 5/00 (2006.01); C22B 3/02 (2006.01); C22B 3/04 (2006.01); C22B 15/00 (2006.01);
U.S. Cl.
CPC ...
C22B 3/02 (2013.01); C22B 3/04 (2013.01); C22B 15/0065 (2013.01);
Abstract

A method of heap leaching including forming a heap lift, installing a horizontal solution collection system between the heap layers including a horizontal tubing with a wireline data collection tool disposed therein, providing a heap leach model for modeling the heap leach operation including a solvent formulation and a irrigation setting, obtaining collected data from the wireline data collection tool while irrigating the heap lift, the collected data including in-situ material parameters of the heap layers and in-situ solution parameters of the solution flowing in the heap layers, modeling the heap leach operation using the collected data based on the heap leach model to generate a result, and adjusting the heap leach operation based on the result.


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