The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2015

Filed:

Jan. 28, 2013
Applicant:

Dai-ichi Seiko Co., Ltd., Kyoto-shi, JP;

Inventors:

Takeshi Hirakawa, Tokyo, JP;

Yoichi Hashimoto, Tokyo, JP;

Assignee:

Dai-Ichi Seiko Co., Ltd., Kyoto-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01R 9/05 (2006.01); H01R 24/46 (2011.01); H01R 24/50 (2011.01); H01R 13/703 (2006.01);
U.S. Cl.
CPC ...
H01R 9/05 (2013.01); H01R 24/46 (2013.01); H01R 24/50 (2013.01); H01R 13/7033 (2013.01); H01R 2201/20 (2013.01);
Abstract

With a simple configuration, plastic deformation of contacts can be prevented while avoiding increase in size, and occurrence of failure in electrical connection due to dust can be well prevented. In an elastic beam-like member of a first-side contact extending like a cantilever in an insulating housing, a bent extending part which substantially increases the span length of the elastic beam-like member is formed to be bent to have a curved shape at a root part serving as a part coupled to a fixing base part. A through hole is formed in a region including at least part of the bent extending part to ensure flexibility while enhancing elasticity of the contact, thereby preventing permanent deformation of the contact. Meanwhile, dust which has entered the equipment is caused to fall through the through hole, thereby ensuring electrical conductivity well.


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