The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2015
Filed:
Nov. 04, 2012
Applicants:
Ming Lai, Dublin, CA (US);
Meijuan Yuan, Dublin, CA (US);
Inventors:
Ming Lai, Dublin, CA (US);
Meijuan Yuan, Dublin, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/02 (2006.01); A61B 3/18 (2006.01);
U.S. Cl.
CPC ...
A61B 3/18 (2013.01); A61B 3/1015 (2013.01);
Abstract
The present invention contemplates a refraction system to integrate the objective and subjective measurement into a single instrument. The present invention also contemplates a refraction system with open-field and binocular viewing to overcome instrument myopia and to mimic viewing experience of a phoropter. The present invention further contemplates a refraction system employing a pair of optical trombones to eliminate the need of flipping plurality sets of trial lenses for defocus power correction.