The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 24, 2015
Filed:
Sep. 23, 2009
Masaya Suzuki, Okazaki, JP;
Mizuki Nagae, Okazaki, JP;
Takashi Kuramata, Okazaki, JP;
Tokai Optical Co. Ltd., Aichi, JP;
Abstract
A plurality of to-be-evaluated lenses that differ in lens surface design from one another is prepared in an evaluation-value calculating step. Thereafter, a subject's predetermined biological information, e.g., brain waves, is measured for each of the to-be-evaluated lenses by allowing the subject to wear each of the lenses, and an evaluation value for each of the lenses is calculated relative to a predetermined index in the brain waves, for example, relative to a 'state of being under stress.' Thereafter, a correlation between the calculated evaluation value and a lens surface shape is calculated as an index characteristic in a lens-surface-shape determining step. Thereafter, a lens surface shape of a suitable spectacle lens in the index is determined based on the index characteristic, and the lens surface shape is fed back as a shape of a to-be-evaluated lens of the evaluation-value calculating step.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile