The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8984957 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 24, 2015

Filed:

Sep. 14, 2012
Applicants:

Allen Hagerman Reed, Bay St. Louis, MS (US);

Guoping Zhang, Baton Rouge, LA (US);

Hang Yin, Baton Rouge, LA (US);

David C Young, Long Beach, MS (US);

Inventors:

Allen Hagerman Reed, Bay St. Louis, MS (US);

Guoping Zhang, Baton Rouge, LA (US);

Hang Yin, Baton Rouge, LA (US);

David C Young, Long Beach, MS (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus and methods for testing sediment submerged in liquid and manufacturing the apparatus. The apparatus and methods of the present embodiment can provide for nano/micro characterization of mechanical properties of materials submerged in liquid, facilitating specimen preparation and installation, and can provide hydrated materials. The apparatus can include cell walls with optical magnifying lenses so that the materials can be viewed without the aid of a microscope.


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Reed, Allen. (2015). System and method for testing of micro-sized materials (U.S. Patent No. 8984957). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8984957

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