The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Oct. 11, 2013
Applicant:
Raytheon Company, Waltham, MA (US);
Inventors:
Shannon V. Davidson, Hillsboro, MO (US);
Anthony N. Richoux, Richardson, TX (US);
Assignee:
Raytheon Company, Waltham, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/46 (2006.01); G06F 9/45 (2006.01); G06F 9/50 (2006.01); G06F 11/14 (2006.01); G06F 11/20 (2006.01);
U.S. Cl.
CPC ...
G06F 9/50 (2013.01); G06F 9/5038 (2013.01); G06F 9/5066 (2013.01); G06F 9/5072 (2013.01); G06F 9/5077 (2013.01); G06F 11/1482 (2013.01); G06F 11/2025 (2013.01);
Abstract
A method for job management in an HPC environment includes determining an unallocated subset from a plurality of HPC nodes, with each of the unallocated HPC nodes comprising an integrated fabric. An HPC job is selected from a job queue and executed using at least a portion of the unallocated subset of nodes.