The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Jan. 14, 2011
Devesh Bhatt, Morristown, NJ (US);
Steve Hickman, Morristown, NJ (US);
Manish Patodi, Morristown, NJ (US);
David V. Oglesby, Morristown, NJ (US);
Kirk Schloegel, Morristown, NJ (US);
Devesh Bhatt, Morristown, NJ (US);
Steve Hickman, Morristown, NJ (US);
Manish Patodi, Morristown, NJ (US);
David V. Oglesby, Morristown, NJ (US);
Kirk Schloegel, Morristown, NJ (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
Systems and methods for type and range propagation through data flow models are provided. In one embodiment, a test generating system for processing data flow diagrams, the system comprises: a processor programmed to perform a test generation process; and at least one memory device coupled to the processor, the at least one memory device including a data flow diagram. The test generation process computes range information and data type information for outputs of one or more functional blocks defined by the data flow diagram by applying transformations to input range information for inputs of each of the one or more functional blocks. The transformations are at least in part performed by applying specific mathematical and functional effects that are pre-defined for each of the one or more functional blocks based on block type.