The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Mar. 11, 2011
Soo-jung Ryu, Hwaseong-si, KR;
Choon-ki Jang, Anyang-si, KR;
Jaejin Lee, Seoul, KR;
Bernhard Egger, Seoul, KR;
Young-chul Cho, Yongin-si, KR;
Soo-Jung Ryu, Hwaseong-si, KR;
Choon-Ki Jang, Anyang-si, KR;
Jaejin Lee, Seoul, KR;
Bernhard Egger, Seoul, KR;
Young-Chul Cho, Yongin-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
SNU R&DB Foundation, Seoul, KR;
Abstract
Provided is an apparatus and method for generating code overlay capable of minimizing the number of memory copies. A static temporal relationship graph (STRG) is generated in which each of functions of a program corresponds to a node of the STRG and a conflict miss value corresponds to an edge of the STRG. The conflict miss value is the maximum number of possible conflict misses between functions. Overlay is generated by selecting at least one function from the STRG, calculating an allocation cost for each region of a memory to be given when the at least one selected function is allocated, and allocating the at least one selected function to a region that has the smallest allocation cost.