The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Aug. 31, 2012
Ashraf AL Za'noun, Raleigh, NC (US);
Lisa Wilson, Chicago, IL (US);
Ashraf Al Za'noun, Raleigh, NC (US);
Lisa Wilson, Chicago, IL (US);
Accenture Global Services Limited, Dublin, IE;
Abstract
A data quality analysis and management system includes a data quality testing module to perform data quality tests on received data and determine data quality statistics from the execution of the data quality tests. The system also includes a data quality analysis and management engine to determine data quality cost metrics including cost of setup, cost of execution, internal data cost, and external data cost, and calculate a cost of data quality from the data quality cost metrics, and a reporting module to generate a data quality scorecard including statistics determined from execution of the data quality tests by the data quality testing module and the cost of data quality determined by the data quality analysis and management engine.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile