The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Sep. 28, 2012
Applicants:

Sivasakthivel Sadasivam, Chennai, IN;

Kannan Kariraman, Chennai, IN;

Takameren Longkumer, Chennai, IN;

Inventors:

Sivasakthivel Sadasivam, Chennai, IN;

Kannan Kariraman, Chennai, IN;

Takameren Longkumer, Chennai, IN;

Assignee:

HCL Technologies Limited, Chennai, Tamil Nadu, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/263 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/263 (2013.01); G06F 11/3688 (2013.01);
Abstract

Device Test Automation framework. This embodiment provides a device test automation framework for automating testing of embedded systems. The device test automation framework—DTAF allows user to test embedded device software using test scripts, which can capture various interfaces of device under test. A Graphical User Interface—GUI tool is created based on device under test configuration and user input. This GUI tool shows various interface of device under test. A device test automation framework hardware enables communication between test tool and the device under test. DTAF allows testing process to dramatically improve productivity, effectiveness, efficiency and coverage of embedded software testing


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