The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Oct. 30, 2012
Applicant:

Oracle International Corporation, Redwood City, CA (US);

Inventors:

Jonathan D. Klein, Redwood Shores, CA (US);

Aleksey M. Urmanov, San Diego, CA (US);

Anton A. Bougaev, San Diego, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 15/173 (2013.01); G06F 11/3096 (2013.01);
Abstract

In general the invention relates to a method for processing signals from a data server. The method includes obtaining, by a monitoring facility, a measured signal from the data server, wherein the monitoring facility comprises a central processing unit, generating a first probing characteristic from the measured signal, and determining that the first probing characteristic is measureless. The method further includes decomposing, by the central processing unit in response to the determination, the first probing characteristic into a plurality of component parts, constructing a reconstructed signal using a first one of the plurality of component parts, generating a second probing characteristic using the reconstructed signal, wherein the second probing characteristic is not measureless, and processing the reconstructed signal by the monitoring facility.


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