The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Sep. 22, 2011
Applicants:

David Kung, Cupertino, CA (US);

Marc Maillart, Paris, FR;

Suryanarayana Mangipudi, San Ramon, CA (US);

Aun-khuan Tan, Sunnyvale, CA (US);

Inventors:

David Kung, Cupertino, CA (US);

Marc Maillart, Paris, FR;

Suryanarayana Mangipudi, San Ramon, CA (US);

Aun-Khuan Tan, Sunnyvale, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06Q 10/10 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/10 (2013.01);
Abstract

Various embodiments of systems and methods for evaluating a trust value for a report are disclosed herein. The method includes obtaining one or more reports by the computer, where the reports are formed of one or more fields of data. An end-to-end lineage for the data is determined to trace the data back to the data source system from which the data had originated initially. Further, the method includes validating each of the multiple data source systems including intermediate tables, and determining a data quality score for each of the multiple data source systems. A trust value for the report is calculated based on the data quality scores for the one or more data source systems and intermediate tables, and rendered along with the report.


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