The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Jun. 25, 2013
Applicant:
Raytheon Company, Waltham, MA (US);
Inventors:
Paul M. Ingram, Jr., Dallas, TX (US);
Joseph C. Landry, Dallas, TX (US);
John J. Coogan, Bedford, TX (US);
Paul D. Shocklee, Plano, TX (US);
Assignee:
Raytheon Company, Waltham, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G01S 7/41 (2006.01); G01S 7/48 (2006.01); G01S 13/90 (2006.01); G01S 17/89 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G01S 7/411 (2013.01); G01S 7/4802 (2013.01); G01S 13/9035 (2013.01); G01S 17/89 (2013.01);
Abstract
In one example of a method for remote identifying a non-Lambertian target material, a spectral signature for a target is determined from each of at least two different sets of imagery acquired at different angles, and compared to a predicted signature for a candidate material for each of the at least two different angles. The predicted signatures take into account the known anisotropy of reflectance, and thus also radiance, of the candidate material.