The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Oct. 01, 2010
Wei D. Wang, Troy, MI (US);
Steven E. Schulz, Torrance, CA (US);
Jeffrey David, Milford, MI (US);
Jackie L Cui, Torrance, CA (US);
Andrew M. Zettel, Ann Arbor, MI (US);
Hanne Buur, Brighton, MI (US);
Wei D. Wang, Troy, MI (US);
Steven E. Schulz, Torrance, CA (US);
Jeffrey David, Milford, MI (US);
Jackie L Cui, Torrance, CA (US);
Andrew M. Zettel, Ann Arbor, MI (US);
Hanne Buur, Brighton, MI (US);
GM Global Technology Operations LLC, Detroit, MI (US);
Abstract
A method includes detecting a first event and executing a first procedure to identify a sensor offset in response to detecting the first event. The method further includes determining, via a computing device, whether the sensor offset was measured during the execution of the first procedure, scheduling a second procedure to execute in response to detecting a second event if the sensor offset was not measured during the first procedure, and scheduling the first procedure to execute in response to detecting a subsequent occurrence of the first event if the sensor offset was measured during the first procedure.