The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Dec. 12, 2011
Anh Luong, Santa Clara, CA (US);
Daniel C. Kong, Mountain View, CA (US);
Anh Luong, Santa Clara, CA (US);
Daniel C. Kong, Mountain View, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Wireless communications circuitry such as radio-frequency power amplifiers may be tested using a test station. A test station may include a test host and a test unit coupled to the test host. The power amplifiers may be configured to transmit radio-frequency signals in allocated resource blocks within a particular radio channel. The power amplifier circuits may be configured to transmit signals utilizing only an allocated portion of its total available resource blocks so that the transmitted signals are output at maximum power levels. The power amplifiers may transmit in resource blocks near a low channel edge during a first time period and may transmit in resource blocks near a high channel edge during a second time period. The test unit may receive the signals generated from the power amplifiers and may perform desired radio-frequency measurements (e.g., test unit may measure adjacent channel leakage radio, signal-to-interference ratio, error vector magnitude, etc.).