The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
May. 03, 2012
Stephane Coulombe, Brossard, CA;
Soroosh Rezazadeh, Montreal, CA;
Stephane Coulombe, Brossard, CA;
Soroosh Rezazadeh, Montreal, CA;
Ecole de Techbologie Superieure, Montreal, CA;
Abstract
A visual quality assessment method and system are based on deriving a quality metric by comparing sub-band approximations of a distorted image and an undistorted version of the same image, providing a good compromise between computational complexity and accuracy. The sub-band approximations are derived from Discrete Wavelet (Haar) transforms of small image blocks of each image. Due to inherent symmetries, the wavelet transform is 'blind' to certain types of distortions. But the accuracy of the method is enhanced, and the blindness of the transform is overcome, by computing quality metrics for the distorted image as well as computing quality metrics for a shifted version of the distorted image and combining the results.