The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Apr. 30, 2012
Ping Chen, Beijing, CN;
Chao He, Causeway Bay, HK;
Gary Ross, Edinburgh, GB;
NCR Corporation, Duluth, GA (US);
Abstract
A method of categorizing defects in a media item. The method comprising the steps of: receiving a binarised image of the media item, where the binarised image comprises a plurality of pixels, each pixel having either a potential defect intensity or a non-defect intensity; and identifying one or more blobs comprising contiguous pixels each having a potential defect intensity. For each identified blob, the method involves comparing a size of the blob with a damage threshold; ignoring the blob if the blob size is smaller than the damage threshold; and for each identified blob having a size exceeding or equaling the damage threshold, categorizing the identified blob.