The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Mar. 23, 2011
Mingshan Sun, Sunnyvale, CA (US);
Josh Star-lack, Palo Alto, CA (US);
Gary Virshup, Cupertino, CA (US);
Daniel Morf, Buck am Irchel, CH;
Stefan Jochem Thieme-marti, Windisch, CH;
Mingshan Sun, Sunnyvale, CA (US);
Josh Star-Lack, Palo Alto, CA (US);
Gary Virshup, Cupertino, CA (US);
Daniel Morf, Buck am Irchel, CH;
Stefan Jochem Thieme-Marti, Windisch, CH;
Varian Medical Systems, Inc., Palo Alto, CA (US);
Abstract
The claimed subject matter describes a novel technique to measure the beam profile using an area detector. In one embodiment, a set of one-dimensional beam profile measurements is performed by taking two images under the same source conditions but at two different positions of the detector, with each position of the detector shifted by a certain distance in the direction corresponding to the direction of the one-dimensional profile measurement. In further embodiments, a set of two-dimensional beam profile measurements is achieved by determining a second set of one-dimensional profiles from the same sampling points in a second direction and building a two-dimensional map of the beam profile by correlating the first one-dimensional profile measurement with the second one-dimensional profile measurement.