The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

May. 09, 2012
Applicants:

Jong Chul YE, Daejeon, KR;

Kyung Sang Kim, Daejeon, JP;

Inventors:

Jong Chul Ye, Daejeon, KR;

Kyung Sang Kim, Daejeon, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/005 (2013.01); G06T 2211/428 (2013.01);
Abstract

A method and apparatus for reconstructing an image by generating a scatter-corrected sinogram are provided. In the reconstructed image in which initial scattering is not corrected, an emission position of a photon is determined. A graphics processing unit (GPU) calculates migration of the photon using a Monte-Carlo simulation. A 3-dimensional (3D) line of response (LoR) may be calculated through a position in which the photon reaches a detector. The calculated LoR may be converted into a 3D sinogram form and stored in a prompt sinogram and a scatter-corrected sinogram. A final scatter-corrected sinogram may be generated by adjusting a scale of the scatter-corrected sinogram.


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