The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Dec. 05, 2012
Applicants:

Eitan Shelef, Stanford, CA (US);

Jesse Lomask, Oakland, CA (US);

Andrea Fildani, Danville, CA (US);

Inventors:

Eitan Shelef, Stanford, CA (US);

Jesse Lomask, Oakland, CA (US);

Andrea Fildani, Danville, CA (US);

Assignee:

Chevron U.S.A. Inc., San Ramon, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00624 (2013.01); G06T 7/0083 (2013.01); G06T 7/0095 (2013.01); G06T 2207/10032 (2013.01); G06T 2207/20064 (2013.01); G06T 2207/30181 (2013.01);
Abstract

A computer implemented method for detecting a channel system comprises importing channel data, wherein the channel data includes intensity measurements associated with locations in the channel system. The method further comprises calculating, by a processor, directional first derivative data of the intensity measurements; selecting a plurality of localized test wavelets; calculating, by the processor, a plurality of fit-measures, wherein the plurality of fit-measures indicate correlations between the directional first derivatives and the plurality of localized test wavelets; and determining a plurality of selected wavelets from the plurality of localized test wavelets based on the plurality of fit-measures, wherein the plurality of selected wavelets model the channel system.


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