The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Feb. 22, 2013
Naoki Hasegawa, Kyoto, JP;
Naoki Hasegawa, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
An apparatus, system, and method corrects line deficiency in radiographic systems. A Fourier transform element provides a one-dimensional Fourier transform on a line orthogonal to a line of a moire patterns appearing in an X-ray image during a use. A peak frequency detection element detects the peak frequency indicating the spatial frequency of the moire pattern on the basis of the results of one-dimensional Fourier transform. The detected peak frequency is transformed to a number of pixels in 1 cycle of the moire pattern by a pixel cycle conversion element. The line deficiency correction element obtains pixels of the same phase as the line deficiency pixel in the moire pattern from the number of pixels, and then corrects the line deficiency pixel by using the pixel value thereof. Since the number of pixels in 1-cycle is acquired from the moire pattern in the X-ray image, the line deficiency can be corrected.