The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Feb. 07, 2008
Applicants:

Koichi Hirokawa, Tokyo, JP;

Yoshiaki Sugaya, Tokyo, JP;

Toshiyuki Irie, Tokyo, JP;

Inventors:

Koichi Hirokawa, Tokyo, JP;

Yoshiaki Sugaya, Tokyo, JP;

Toshiyuki Irie, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/00 (2006.01); G21K 1/12 (2006.01); H05G 1/60 (2006.01); A61B 6/03 (2006.01); G01T 1/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/542 (2013.01); A61B 6/032 (2013.01); A61B 6/4085 (2013.01); G01T 1/00 (2013.01);
Abstract

An X-ray CT apparatus is configured capable of properly calculating a radiation dosed amount more approximating to an actually exposed radiation dose that includes scattering rays of an examined object from data measured at the scanning time. A function or table showing a relationship between data obtained on the basis of the measured data of the object detected by an X-ray detector at the scanning time and the radiation dosed amount is stored in advance; and the X-ray CT apparatus calculates the radiation dosed amount of the object in accordance with the data obtained on the function or table showing the relationship between the data obtained on the basis of the measured data of the object stored in advance and the radiation dosed amount.


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