The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Mar. 14, 2013
Xerox Corporation, Norwalk, CT (US);
Guo-Yau Lin, Fairport, NY (US);
James Michael Sanchez, Rochester, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
Methods and systems for dynamically detecting and switching profiling configuration in digital rendering. A set of color patches utilized for profiling can be rendered via a calibration engine and the color patches can be measured via inline/offline spectrophotometer. A high-accuracy MFD model can be built based on measurement from the color patches. A set of measurement values for a set of CMYK color probes can be obtained directly from the measurement and/or by processing through a MFD model. A classifier can be configured to determine a toner set based on the predicted and/or measured Lab values. The profiling procedure then automatically sets up a parameter set for the corresponding toner set to build a color look-up table via an inversion and optimization function. A destination ICC profile can be built based on the color LUTs. The system can handle multiple toner sets and produce optimized color outcome for each toner set.