The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Mar. 08, 2011
Katsutoshi Tsurutani, Osaka, JP;
Katsutoshi Tsurutani, Osaka, JP;
Konica Minolta Optics, Inc., Osaka, JP;
Abstract
In a measuring probe () according to the present invention, measuring light is split into a two or more through a split optical system (), and, when each split light is received by a light-receiving sensor (B,B,B) through an interference filter (A,A,A) serving as a color filter, the split light is introduced into the interference filter (A,A,A) through a collecting lens group (C,C,C) formed as a substantially bilateral telecentric system. The interference filter (A,A,A) is formed to obtain a transmittance characteristic corresponding to a measurement parameter, depending on a condition of an intensity distribution with respect to incidents angles of light incident on the interference filter (A,A,A). Thus, the measuring probe () according to the present invention can reduce an influence of a deviation in the transmittance characteristic due to incident angles, even using the interference filter (A,A,A).