The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Nov. 02, 2012
Applicant:

Precitec Optronik Gmbh, Neu-Isenburg, DE;

Inventors:

Martin Schönleber, Aschaffenburg, DE;

Markus Kogel-Hollacher, Haibach, DE;

Assignee:

Precitec Optronik GmbH, Neu-Isenburg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01N 21/25 (2006.01); B23K 26/03 (2006.01); B23K 26/04 (2014.01); B23K 26/08 (2014.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01N 21/255 (2013.01); B23K 26/032 (2013.01); B23K 26/048 (2013.01); B23K 26/0807 (2013.01); G01B 9/02007 (2013.01); G01B 9/02044 (2013.01); G01B 9/02091 (2013.01); G01B 9/02063 (2013.01); G01B 9/02036 (2013.01); G01B 2290/70 (2013.01);
Abstract

A material-working device with working beams of a beam generator and with in-situ measurement of a working distance between the beam generator and a workpiece, the material-working device including a working laser; a laser scanner for the working laser, the laser scanner including a two-dimensional deflecting device with scanner mirrors and a variable refocusing device at varying working distances; and a sensor device including a spectrometer and at least one sensor light source, wherein measuring beams together scan a working area of the workpiece by the laser scanner and an objective lens while gathering the working distance, and the measuring beams of at least two of the light sources of the sensor device being linearly polarized and being coupled into a working beam path of the laser scanner of the material-working device by an optical coupling element in a collimated state with crossed polarization directions.


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