The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Mar. 10, 2010
Applicant:

Tatsuya Ueno, Tokyo, JP;

Inventor:

Tatsuya Ueno, Tokyo, JP;

Assignee:

Azbil Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 3/36 (2006.01); G01S 17/32 (2006.01); G01S 17/58 (2006.01); G01B 9/02 (2006.01); G01S 7/491 (2006.01);
U.S. Cl.
CPC ...
G01S 17/325 (2013.01); G01S 17/58 (2013.01); G01B 9/02092 (2013.01); G01S 7/4915 (2013.01); G01S 7/4916 (2013.01);
Abstract

A physical quantity sensor includes a semiconductor laser for irradiating an object with a laser beam, and a laser driver for operating the semiconductor laser in such a way that a first oscillation period for which the oscillation wavelength increases and/or a second oscillation period for which the oscillation wavelength decreases is repetitively present. The sensor further includes a photodiode and a current-voltage conversion amplifying unit both for detecting an MHP containing an interference waveform formed by the self-coupling effect between the laser beam and the returning light beam from the object, a MHP extracting unit for measuring the period of the interference waveform contained in the output signal from the current-voltage conversion amplifying unit each time the interference waveform is inputted, and a computing unit for computing the displacement and/or the speed of the object from the measured individual period MHP extracting unit.


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