The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Jul. 30, 2013
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Makoto Asuka, Tokyo, JP;

Hiroyuki Miyahara, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/64 (2006.01); H04N 5/217 (2011.01);
U.S. Cl.
CPC ...
H04N 5/2176 (2013.01);
Abstract

An image processing apparatus is provided which minimizes reduction in S/N ratio and deterioration in resolution feeling at the lens periphery when the peripheral light amount drop correction of the lens is performed. An image processing LSI to perform the peripheral light amount drop correction of the imaging lens includes a space-direction noise removal correction part and a time-direction noise removal correction part. As the distance from the lens center position increases, the space-direction noise removal correction part reduces the noise reduction correction intensity to the image region to which the light amount drop correction gain is added in each image. As the distance from the lens center increases, the time-direction noise removal correction part increases the noise removal correction intensity to the image region to which the light amount drop correction gain is added in each image.


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