The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Apr. 22, 2010
Applicants:

Hideto Takeuchi, Tokyo, JP;

Akihiro Hokimoto, Kanagawa, JP;

Inventors:

Hideto Takeuchi, Tokyo, JP;

Akihiro Hokimoto, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G06K 9/00 (2006.01); G06T 7/20 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00771 (2013.01); G06T 7/2093 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/30232 (2013.01);
Abstract

Monitoring system is provided which includes an image capturing apparatus including a basic analysis section that performs analysis processing based on image data input from an image capturing section that captures an image of a subject and generates first metadata, and a first metadata output section that outputs the first metadata and second metadata different from the first metadata to a monitoring apparatus connected to a network via the network, and an analysis apparatus including an extended analysis section that performs analysis processing different from that of the basic analysis section based on the image data received from the image capturing apparatus and generates the second metadata, and a second metadata output section that outputs the second metadata to the image capturing apparatus.


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