The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Oct. 04, 2010
Jung Soon Jang, Bellevue, WA (US);
Jung Soon Jang, Bellevue, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method and apparatus for inspecting an object. In response to a presence of the object in an inspection area, a volume containing the object is identified. The volume has a plurality of portions. A number of sensor systems is assigned to the plurality of portions of the volume. Each sensor system in the number of sensors systems is assigned to a number of portions in the plurality of portions of the volume based on whether each sensor system is able to generate data with a desired level of quality about a surface of the object in a particular portion in the plurality of portions. Data about the surface of the object is generated using the number of sensor systems assigned to the plurality of portions of the volume. A determination is made as to whether a number of inconsistencies is present on the surface of the object using data.