The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Apr. 05, 2012
Valerica Raicu, Shorewood, WI (US);
Michael Stoneman, Milwaukee, WI (US);
Valerica Raicu, Shorewood, WI (US);
Michael Stoneman, Milwaukee, WI (US);
UWM Research Foundation, Inc., Milwaukee, WI (US);
Abstract
A system and method of high-speed microscopy using a two-photon microscope with spectral resolution. The microscope is operable to provide spectrally resolved, multi-dimensional images from a single scan of a sample. The microscope may include one of a multi-beam point scanning microscope, a single beam line scanning microscope, and a multi-beam line scanning microscope. The microscope includes a descanning arrangement such that emitted fluorescence is static on a receiving detector. The detector is a narrow detector with a width at least half the size of the length, to reduce the amount of pixel data being transmitted and improve scan speeds. The microscope may also incorporate one or more binning techniques whereby pixels are binned together to improve resolution or scan speeds.