The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Dec. 19, 2013
Applicant:

Stmicroelectronics S.r.l., Agrate Brianza, IT;

Inventors:

Giuseppe Spinella, Biancavilla, IT;

Daniele De Pascalis, Cornaredo, IT;

Marco Vito Sapienza, Catania, IT;

Maria Ceravolo, Milan, IT;

Eugenio Miluzzi, Milan, IT;

Assignee:

STMicroelectronics S.r.l., Agrate Brianza, IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 41/00 (2013.01); G05F 1/625 (2006.01); G01P 15/125 (2006.01); G01D 5/244 (2006.01);
U.S. Cl.
CPC ...
G05F 1/625 (2013.01); G01P 15/125 (2013.01); G01D 5/2448 (2013.01);
Abstract

An offset-compensation circuit in a MEMS sensor device, provided with a micromechanical detection structure that transduces a quantity to be detected into an electrical detection quantity, and with an electronic reading circuit, coupled to the micromechanical detection structure for processing the electrical detection quantity and supplying an output signal, which is a function of the quantity to be detected. A compensation structure is electrically coupled to the input of the electronic reading circuit and can be controlled for generating an electrical compensation quantity, of a trimmable value, for compensating an offset on the output signal; the compensation circuit has a control unit, which reads the output signal during operation of the MEMS sensor device; obtains information on the offset present on the output signal itself; and controls the compensation structure as a function of the offset information.


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