The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2015
Filed:
Jul. 29, 2011
Matthew S. Bottkol, Boston, MA (US);
Richard D. Elliott, Stoneham, MA (US);
Michael Y. Feng, Winchester, MA (US);
Thomas F. Marinis, Haverhill, MA (US);
Michael F. Mcmanus, Halifax, MA (US);
Shan Mohiuddin, Boston, MA (US);
Peter G. Sherman, Cambridge, MA (US);
John E. Pritchett, Baltimore, MD (US);
Jeffery W. Warren, Ellicott City, MD (US);
Charles H. Lange, Woodbine, MD (US);
Matthew S. Bottkol, Boston, MA (US);
Richard D. Elliott, Stoneham, MA (US);
Michael Y. Feng, Winchester, MA (US);
Thomas F. Marinis, Haverhill, MA (US);
Michael F. Mcmanus, Halifax, MA (US);
Shan Mohiuddin, Boston, MA (US);
Peter G. Sherman, Cambridge, MA (US);
John E. Pritchett, Baltimore, MD (US);
Jeffery W. Warren, Ellicott City, MD (US);
Charles H. Lange, Woodbine, MD (US);
The Charles Stark Draper Laboratory, Inc., Cambridge, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
A micro-electro-mechanical systems (MEMS) inertial measurement system facilitates accurate location and/or attitude measurements via passive thermal management of MEMS inertial sensors. Accuracy of the system is also improved by subjecting the inertial sensors to programmed single-axis gimbal motion, and by performing coarse and fine adjustments to the attitude estimates obtained by the system based on the programmed motion and on the passive thermal management of the sensors.