The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2015

Filed:

Dec. 13, 2011
Applicants:

Thilo Trapp, Aliso Viejo, CA (US);

Torsten Pechstein, Radebeul, DE;

Inventors:

Thilo Trapp, Aliso Viejo, CA (US);

Torsten Pechstein, Radebeul, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 35/00 (2006.01); G01N 27/416 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00693 (2013.01); G01N 27/4165 (2013.01); G01N 35/00712 (2013.01);
Abstract

A method for start-up of a measuring device, which is embodied to monitor by means of at least one measuring transducer in contact with the interior of a process container, especially of a single-use container, a measured variable of a medium contained in the process container, wherein, for ascertaining a measured value, at least one measurement signal of the measuring transducer is mapped to a measured value of the measured variable according to a predetermined characteristic curve, wherein the method includes: introducing a process medium into the process container; bringing the measuring transducer in contact with the process medium; and performing a one-point calibrating of the measuring device based on a measurement signal registered by the measuring transducer in the process medium or a measured value derived therefrom based on the characteristic curve.


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